University hosts conference bringing experts in smart specification together

Experts in the field of smart specification and verification within manufacturing descended on the University of Huddersfield last week.

Around 60 delegates attended the international 18^th CIRP Conference on Computer Aided Tolerancing which was hosted by the University and its renowned Centre for Precision Technologies (CPT).

Held on campus at the University’s Charles Sikes Building, the three-day event brought together academics to meet, exchange ideas and showcase their latest research in the field of smart specification and verification.

The conference, which was organised by the University of Huddersfield in collaboration with the University of Bristol, also included a dinner held at The Hepworth Art Gallery in nearby Wakefield.

Themes discussed at the conference included: specification and standardisation, tolerance design, digital twin for geometrical quality, modelling and measuring geometrical deviations, quality control and production metrology​, and data-driven tolerance analysis.

The University of Huddersfield’s world-renowned expert in the field of metrology Professor Dame Xiangqian (Jane) Jiang, who is the chief scientist at the CPT and director of the current Future Metrology Hub, opened the conference.

The keynote speakers at the event comprised: Professor Nabil Anwer of Paris-Saclay University and Director of LURPA; Professor Ed Morse of the University of North Carolina at Charlotte and is Director of the Centre for Precision Metrology; and Professor Liam Blunt, director of the University of Huddersfield’s CPT.

Professor Jiang, CIRP Fellow, commented: “Bringing together leading thinkers from across the metrology landscape is core to the Future Metrology Hub mission and we were delighted to host this conference on behalf of CIRP.”

CIRP is the world leading organisation in production engineering research.